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Materials characterization is a fundamental process in the field of materials science. Without it, scientific understanding of engineering materials can not ascertain.

The [course_title] mainly focuses on microstructural characterization of materials. Through this extensive course, you will learn about the basic principles and techniques of X-ray diffraction, optical, scanning electron and transmission electron microscopy. This course also presents the instrument details, features and imaging experiments through videos.


This course does not involve any written exams. Students need to answer 5 assignment questions to complete the course, the answers will be in the form of written work in pdf or word. Students can write the answers in their own time. Each answer needs to be 200 words (1 Page). Once the answers are submitted, the tutor will check and assess the work.


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Course Credit: NPTEL

Course Curriculum

Module: 01
Properties of light, Image formation 01:09:00
Magnification and resolution 00:51:00
Depth of field,focus and field of view 00:50:00
Lens defects,filters and light microscopy introduction 00:50:00
Optical microscope demo., Bright field imaging, opaque specimen illumination 00:45:00
Opaque stop microscopy, Phase contrast microscopy 00:48:00
Dark field microscopy, Polarization microscopy 00:35:00
Differential interference contrast and fluorescence microscopy 00:45:00
Sample preparation techniques for optical microscopy 00:51:00
Tutorial problems 00:44:00
continuation-Tutorial problems 00:26:00
Module: 02
Introduction to scanning electron Microscopy 00:44:00
Lens aberrations, Object resolution, Image quality 00:48:00
Interaction between electrons and sample, Imaging capabilities 00:50:00
SEM and its mode of operation, Effect of aperture size,Working distance,condenser lens strength 00:43:00
SEM and its mode of operation- continuation 00:43:00
Factors affecting Interaction volume, Demonstration of SEM 00:32:00
Image formation and interpretation 00:43:00
Image formation and interpretation continued, EDS, WDS 00:40:00
Special contrast mechanisms, Monte Carlo simulations of Interaction volume 00:48:00
Electron channeling contrast imaging (ECCI), (EBSD)-Theory & instrument demonstration 00:45:00
Tutorial Problems on SEM 00:48:00
Module: 03
Basics of X-ray emission from source, electron excitation and X-ray interaction 00:44:00
Properties of X-rays 00:46:00
Bragg’s Law Derivation 00:38:00
Diffraction relationship with reciprocal space 00:47:00
X-ray scattering 00:45:00
Factors affecting intensities of X-ray peaks 00:51:00
Factors affecting intensities of X-ray peaks- continuation 00:51:00
Effect of crystallite size and strain on intensity of X-rays 00:48:00
Profile fit, Factors affecting peak brodening 00:43:00
Indexing of diffraction pattern, Quantitative analysis 00:50:00
Indexing, Quantitative analysis-continuation, Residual stress measurements 00:57:00
Module: 04
XRD and Residual stress measurement- lab demonstration 00:39:00
Introduction to Transmission Electron Microscopy (TEM) 00:46:00
Fundementals of Transmission Electron Microscopy (TEM) 00:48:00
Basics of Diffraction-1 00:48:00
Basics of Diffraction-2 00:45:00
TEM imaging-1 00:51:00
TEM imaging-2 00:28:00
TEM instrument demonstration 00:31:00
TEM sample preparation-1- 00:53:00
TEM sample preparation-2 00:41:00
Submit Your Assignment 00:00:00
Certification 00:00:00

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